Zhang, Cher Xuan; Francis, Sarah Ashley; Zhang, En Xia; Fleetwood, Daniel M.; Schrimpf, Ronald D.; Galloway, Kenneth F.; Simoen, Eddy; Mitard, Jerome; Claeys, Cor (2011). Effect of Ionizing Radiation on Defects and <formula formulatype="inline"><tex notation="TeX">$1/f$</tex></formula> Noise in Ge pMOSFETs. IEEE Transactions on Nuclear Science, 58(3), 764–769.
doi:10.1109/tns.2011.2128347
url to share this paper:
An interview with Sci-Hub Founder Alexandra Elbakyan Who exactly should pay for academic research