Zediker, Mark S.; Kanskar, M.; Bao, L.; Bai, J.; Chen, Z.; Dahlen, D.; DeVito, M.; Dong, W.; Grimshaw, M.; Haden, J.; Guan, X.; Hemenway, M.; Kennedy, K.; Martinsen, R.; Tibbals, J.; Urbanek, W.; Zhang, S. (2014). SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, United States (Saturday 1 February 2014)] High-Power Diode Laser Technology and Applications XII - High reliability of high power and high brightness diode lasers. , 8965(), 896508–.
doi:10.1117/12.2040851
url to share this paper:
An interview with Sci-Hub Founder Alexandra Elbakyan Who exactly should pay for academic research